The 1st International Workshop on Ontology content and evaluation in Enterprise (With two tracks on Human Resources and eHealth)
Oct 31 , 2006 , Montpellier, France
In conjunction with OnTheMove Federated Conferences (OTM'06) Proceedings will be published by Springer LNCS
This workshop is organized by the Ontology Outreach Advisory OOA (Knowledge Web NoE). The OOA is devoted to develop strategies for ontology recommendation and standardization, thereby promoting and providing outreach for verifiable quality ontological content.
(See the next OntoContent_2007)
* Ontological evaluation. * Logical evaluation. * Usability/usefulness evaluation. * Ontology compliance to standards. * Ontology standardization and recommendation scenarios. * Ontology metadata, and libraries. * Ontology documentation. * Ontology registration and certification. * Ontology interoperability. * Consensus reaching. * Business cases studies.
Ontologies in Human Resources
* Modeling and representation of: Jobs, CVs, Competencies, Skills, Employees, People, Organizations, Social Events, etc. * HR upper level concepts. * Semantics of HR-XML. * Semantic metadata for HR applications. * Semantics in job matching. * Semantics is learning technologies. * Multilinguality in human resources ontologies. * Best practice and semantic patterns in ontology modeling and evaluation.
Ontologies for Healthcare and Life sciences
* Ontologies in Biomedicine and bioinformatics. * Ontologies of diseases, nursing, therapeutics, drug, etc. * Upper level concepts of healthcare and life sciences ontologies. * Semantic metadata for Clinical Data Interchange. * Semantics of medical XML standards and vocabularies. * Multilinguality in Biomedicine and bioinformatics ontologies. * Best practice and semantic patterns in ontology modeling and evaluation
 Organizers and program chairs
* Mustafa Jarrar, STARLAb, Vrije Universiteit Brussel, Belgium * Claude Ostyn, IEEE-LTSC, USA * Werner Ceusters, University of Buffalo ,USA * Andreas Persidis, Biovista, Greece
 Program Committee
* Adil Hameed, Catalysoft, UK * Alain Leger, FranceTelecom, France * Aldo Gangemi, Laboratory for Applied Ontology, ISTC-CNR, Rome, Italy * André Valente, Knowledge Systems Ventures, USA * Andrew Stranieri, JUSTSYS, Ballarat, Australia * Avigdor Gal, Technion - Israel Institute of Technology * Barry Smith, State University of New York at Buffalo, USA * Bill Andersen, Ontology Works, US * Bob Colomb, The University of Queensland, Australia * Christiane Fellbaum, Cognitive Science Laboratory, Princeton University, USA * Christopher Brewster, University of Sheffield, UK * Ernesto Damiani, Computer Science Department, Milan University, Italy * Fausto Giunchiglia, University of Trento, Italy * Francesco Danza, Expert System SpA, Italy * Francky Trichet, LINA - Computer Science Research Institute, University of Nantes, France * Giancarlo Guizzardi, University of Twente, The Netherlands * Giorgos Stamou, National Technical University of Athens, Greece * Hans Akkermans, Vrije Universiteit Amsterdam, The Netherlands * Harith Alani, University of Southampton, UK * Jeff Pan, University of Aberdeen, UK * Jens Lemcke, SAP, Germany * John Sowa, IBM, USA * Joost Breuker, University of Amsterdam, The Netherlands * Karl Stroetmann, Empirica, Germany * Kewen Wang, Griffith University, Australia * Luk Vervenne, Synergetics, Belgium * Lina Al-Jadir, Swiss Federal Institute of Technology, Switzerland * Miguel-Angel Sicilia, University of Alcalá, Spain * Mohand-Said Hacid, University Claude Bernard Lyon 1 LIRIS - Villeurbanne, France * Nikolay Mehandjiev, University of Manchester, UK * Paolo Bouquet, University of Trento, Italy * Paul Piwek, Open university, UK * Robert Meersman, STARLAb, Vrije Universiteit Brussel, Belgium * Robert Tolksdorf, Free university of Berlin, Germany * Sergio Tessaris, Free University of Bozen-Bolzano, Italy * Silvie Spreeuwenberg, LibRT, The Netherlands * Simon White, Catalysoft, UK * Stephen McGibbon, Microsoft, UK * Theo Mensen, CWI, The Netherlands * Yannick Legré, CNRS, France * Yannis Charalabidis, National Technical University of Athens, Greece * Yaser Bishr, Image Matters, USA